On Defects, they've shown around the micron scale which they increase no new defects to the layer transferred on the SmartSiC, even so potential do the job to extend that to the total wafer would provide certainty of your macro pattern. The chance for unbiased validation of those substrates would https://x.com/Anumhsite/status/1809237468845400459
Little Known Facts About Specific heat of silicon carbide.
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